The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Sep. 05, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tomoaki Sugisawa, Tokyo, JP;

Nobuyuki Yamamoto, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2023 (2013.01); G06F 2201/82 (2013.01);
Abstract

A distributed processing method to receive data by a plurality of servers each including a processor and a memory, and process the data by replicating, the method includes a first determination step in which the servers each receive the replicated data, and a first determination unit determines a degree of consistency of the received data and an output step in which the servers each receive a determination result of the degree of consistency of the data from the first determination unit, and if the determination result includes data that guarantees consistency, the server outputs the data that guarantees consistency. A first number of servers that are to receive the data is set in advance based on a prescribed allowable number of failures that defines the number of servers that can have failures, and an allowable number of byzantine failures that defines the number of servers that can have byzantine failures.


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