The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Feb. 04, 2019
Applicant:

Servicenow, Inc., Santa Clara, CA (US);

Inventors:

Lingzhu Li, Mountain View, CA (US);

Abhay Narayan Kulkarni, Pleasanton, CA (US);

Matthew David Lloyd, Santa Clara, CA (US);

Assignee:

ServiceNow, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 17/18 (2006.01); G06K 9/62 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/3409 (2013.01); G06F 17/18 (2013.01); G06K 9/6282 (2013.01);
Abstract

The present disclosure provides systems and methods for classifying incidents based on determining an odds ratio that represents a likelihood of an incident being related to the problem, classifying incidents based on determining a decision tree that forms branches based on whether a feature is present in the incident, and predicting whether a new incident is related to a problem. Features may be extracted from a set of incidents (e.g., that are reported over a certain time period) that include incidents related to a problem and incidents not related to the problem. The incidents related to the problem and a portion of the incidents not related to the problem may be used to train a logistic regression model or generate a decision tree. The trained logistic regression model may be used to determine the odds ratios or predict whether a new incident is related to a problem.


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