The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Oct. 25, 2019
Applicant:

Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Frank Wippermann, Meiningen, DE;

Andreas Brückner, Gröbenzell, DE;

Jacques Duparré, Jena, DE;

Alexander Oberdörster, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 27/10 (2006.01); G02B 13/00 (2006.01); G02B 26/08 (2006.01); G02B 27/64 (2006.01);
U.S. Cl.
CPC ...
G02B 27/106 (2013.01); G02B 13/0065 (2013.01); G02B 26/0816 (2013.01); G02B 26/0875 (2013.01); G02B 27/646 (2013.01); H04N 5/2254 (2013.01); H04N 5/2259 (2013.01);
Abstract

A multi-aperture imaging device includes an image sensor and an array of optical channels, wherein each optical channel includes an optic for imaging at least a part of a total field of view onto an image sensor region of the image sensor. The multi-aperture imaging device includes a beam-deflector including at least one beam-deflecting element for deflecting an optical path of an optical channel, wherein each optical channel is assigned a beam-deflecting element. The beam-deflecting element is configured to have a transparent state of a controllable surface based on first electric control and to have a reflecting state of the controllable surface based on a second electric control in order to deflect the optical path.


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