The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Apr. 24, 2018
Applicants:

A. E. Dixon, Waterloo, CA;

Savvas Damaskinos, Waterloo, CA;

Alfonso Ribes, Waterloo, CA;

Jasper Hayes, Waterloo, CA;

Inventors:

A. E. Dixon, Waterloo, CA;

Savvas Damaskinos, Waterloo, CA;

Alfonso Ribes, Waterloo, CA;

Jasper Hayes, Waterloo, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0036 (2013.01); G02B 21/006 (2013.01); G02B 21/0052 (2013.01); G02B 21/26 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01);
Abstract

According to some examples, an instrument for scanning a specimen on a specimen holder. The instrument includes a scanning stage for supporting the specimen, and a detector having a plurality of pixels. The scanning stage and the detector are movable relative to each other to move the specimen in a scan direction during a scan. At least some of the pixels of the detector are operable to collect light from different depths inside the specimen during the scan and generate corresponding image data. The instrument also includes a processor operable to perform MSIA on the image data to generate a 3D image of the specimen.


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