The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Nov. 28, 2018
Applicant:
Topcon Corporation, Tokyo-to, JP;
Inventors:
Naoto Takahashi, Tokyo-to, JP;
Yasushi Tanaka, Tokyo-to, JP;
Assignee:
TOPCON Corporation, Tokyo-to, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); G01S 7/481 (2006.01); G01S 17/42 (2006.01); G01C 15/00 (2006.01); G01S 17/86 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01C 15/002 (2013.01); G01S 7/4813 (2013.01); G01S 17/42 (2013.01); G01S 17/86 (2020.01);
Abstract
Provided is a surveying instrument comprises a total station, a mounting base which is fixed on an upper surface of the total station at three points, and a two-dimensional laser scanner which is fixed on an upper surface of the mounting base at three points, wherein the total station is configured to perform a three-dimensional measurement of a measuring point by a first distance measuring light, wherein the two-dimensional laser scanner is configured to acquire point cloud data along a scanning line by a second distance measuring light.