The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 01, 2017
Applicant:

Toshiba Medical Systems Corporation, Otawara, JP;

Inventor:

Anuj Sharma, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/483 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5611 (2013.01); G01R 33/4835 (2013.01); G01R 33/5659 (2013.01);
Abstract

Magnetic resonance imaging (MRI) systems and methods determine slice leakage and/or residual aliasing in the image domain in accelerated MRI imaging. Implementations process one slice of MRI image domain data by input to a sensitivity encoding (SENSE) un-aliasing matrix built from predetermined RF signal reception sensitivity maps, thereby producing as matrix output SENSE-decoded MRI image domain data for one pass through image slice and at least one extra slice, and determine inter-slice leakage and/or in-plane residual aliasing based on content of the at least one extra output slice from the SENSE-decoded MRI image domain data.


Find Patent Forward Citations

Sharma, Anuj. (2021). Determining slice leakage in accelerated magnetic resonance imaging (U.S. Patent No. 11105877). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11105877

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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