The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 13, 2017
Applicant:

Jiangsu University, Jiangsu, CN;

Inventors:

Jie Wang, Jiangsu, CN;

Lei Liu, Jiangsu, CN;

Assignee:

Jiangsu University, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/02 (2006.01); G01N 29/036 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/022 (2013.01); G01N 29/036 (2013.01); G01N 29/222 (2013.01); G01N 2291/014 (2013.01); G01N 2291/0426 (2013.01);
Abstract

A novel light-assisted quartz crystal microbalance and a measurement method thereof. The microbalance comprises a QCM/QCM-D chip, an oscillation circuit, a frequency counter, a computer, a reaction chamber, and a light source. Light emitted from the light source is able to irradiate a surface of the QCM/QCM-D chip. By additionally configuring a light source with the ability to irradiate a chip surface, when irradiated the surface of the QCM/QCM-D chip changes properties thereof, and irradiation of the surface of the QCM/QCM-D chip greatly increases the resonance frequency. Correspondingly, irradiation of the surface of the chip also changes mechanical properties and piezioelectric characteristics of quartz crystal, thereby effectively improving measurement sensitivity of a quartz crystal microbalance apparatus system.


Find Patent Forward Citations

Loading…