The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Mar. 01, 2018
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Kentaro Jinno, Tokyo, JP;
Masaaki Kurokawa, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An eddy current flaw detecting probe includes a plurality of excitation coils () which is configured to generate an eddy current in an inspection target and a plurality of detection coils () which are differentially connected to each other. The plurality of detection coils () includes a first detection coil () which is disposed on a second center line () intersecting a first center line () which connects a center of a first excitation coil () and a center of a second excitation coil () to each other and a second detection coil () which is disposed on a side opposite to the first detection coil () on the second center line (). The excitation coil () and the detection coil () are disposed to be inclined toward an inspection target surface as approaching each other.