The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 15, 2017
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Christopher R. Yungers, St. Paul, MN (US);

Subhalakshmi M. Falknor, Woodbury, MN (US);

David H. Redinger, Afton, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/24 (2006.01); G01N 27/04 (2006.01); G01N 27/20 (2006.01); G01R 31/12 (2020.01);
U.S. Cl.
CPC ...
G01N 27/24 (2013.01); G01N 27/041 (2013.01); G01N 27/20 (2013.01); G01R 31/1263 (2013.01);
Abstract

A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.


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