The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Apr. 02, 2019
Applicant:
The Boeing Company, Chicago, IL (US);
Inventor:
Paul G. Vahey, Seattle, WA (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01J 3/10 (2006.01); G01J 1/42 (2006.01); G01J 3/42 (2006.01); G01J 3/02 (2006.01); G01N 21/03 (2006.01); G01N 21/3577 (2014.01); H01J 49/04 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01J 1/4204 (2013.01); G01J 3/0208 (2013.01); G01J 3/0218 (2013.01); G01J 3/0262 (2013.01); G01J 3/10 (2013.01); G01J 3/42 (2013.01); G01N 21/03 (2013.01); G01N 21/35 (2013.01); G01N 21/3577 (2013.01); H01J 49/0418 (2013.01); G01N 2021/035 (2013.01); G01N 2201/061 (2013.01);
Abstract
A method of analyzing a sample located on a hydrophilic portion of a surface is disclosed. The method includes directing a first incident non-destructive electromagnetic beam through the sample at a non-zero incidence angle relative to the surface. The method also includes analyzing a first reflected non-destructive electromagnetic beam reflected from the hydrophilic portion to obtain a first measurement associated with at least one property of the sample.