The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Oct. 24, 2018
Applicant:

Yokogawa Electric Corporation, Musashino, JP;

Inventors:

Kodai Murayama, Musashino, JP;

Hiroyuki Sugino, Musashino, JP;

Fumie Watanabe, Musashino, JP;

Atsushi Ito, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G02B 5/04 (2006.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); G02B 5/04 (2013.01); G01N 2201/0635 (2013.01); G01N 2201/0638 (2013.01);
Abstract

A spectroscopic analysis device includes: a light source configured to emit light for irradiating a specimen; a prism stuck to the specimen and configured to totally reflect the light emitted from the light source; a polarizing separation element configured to separate the light totally reflected by the prism into a first and second polarized light components that are orthogonal to each other; a wavelength dispersing element configured to disperse respective wavelength components of the first and second polarized light components that are separated by the polarizing separation element; an image capturing element configured to capture respective images of the first and second polarized light components that are dispersed by the wavelength dispersing element; and a processing unit configured to perform component analysis on the specimen by obtaining an absorbency at each wavelength by using an imaging signal output from the image capturing element.


Find Patent Forward Citations

Murayama, Kodai. (2021). Spectroscopic analysis device (U.S. Patent No. 11105737). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11105737

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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