The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Feb. 14, 2019
Presens Precision Sensing Gmbh, Regensburg, DE;
Achim Stangelmayer, Neuburg an der Donau, DE;
Gregor Liebsch, Obertraubling, DE;
Robert J. Meier, Nittendorf, DE;
PreSens Precision Sensing GmbH, Regensburg, DE;
Abstract
A method and measurement system for calibrated measurement of at least one variable of a sample are based on an optical behaviour of at least one sensor substance which depends on the at least one variable. The at least one sensor substance is brought into contact with the sample. At least one calibration area, associated with the at least one sensor substance, is defined. At least one image is recorded which captures at least one of the at least one sensor substance and at least one of the at least one calibration area. The value of the at least one variable of the sample is derived from the at least one image, based on image data associated with the at least one of the at least one sensor substance and on image data associated with the at least one of the at least one calibration area.