The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Dec. 18, 2014
Stichting Radboud Universiteit, Nijmegen, NL;
Umc Utrecht Holding B.v., Utrecht, NL;
Jeroen Jansen, Nijmegen, NL;
Lutgarde Buydens, Nijmegen, NL;
Leo Koenderman, Utrecht, NL;
Bart Hilvering, Utrecht, NL;
Oscar Van Den Brink, Utrecht, NL;
STICHTING RADBOUD UNIVERSITEIT, Nijmegen, NL;
UMC UTRECHT HOLDING B.V., Utrecht, NL;
Abstract
The invention relates to a computer implemented method of analysing data comprising measured values of characteristics of objects in samples, the data comprising —a first set of data (X)' with measured values of characteristics of objects in reference samples; —a test set of data (X) with measured values of the characteristics of objects in a test sample; characterised by the method comprising; —fitting a control model to the first set of data to determine control loadings (P) each representing an independent correlation between characteristics; —projecting the first set of data (X) onto the control loadings (P) for determining a first set control scores (T) and determining one or more confidence intervals for the first set of control scores (T); —projecting the test data onto the control loadings (P) for determining test control scores; —determining if the test control scores are within one or more the confidence intervals.