The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Feb. 20, 2018
Universidad DE Salamanca, Salamanca, ES;
Sphere Ultrafast Photonics, S. L., Coruña, ES;
Iñigo Sola Larrañaga, Salamanca, ES;
Benjamín Alonso Fernández, Salamanca, ES;
Rosa María Romero Muñiz, Oporto, PT;
UNIVERSIDAD DE SALAMANCA, Salamanca, ES;
SPHERE ULTRAFAST PHOTONICS, S.L., Boiro Coruna, ES;
Abstract
An apparatus and a method for in-line measurement of laser pulses with time-dependent polarization are described, which make possible to carry out in-line measurement of laser pulses whose polarization depends on time. For this, one or more polarization projections are selected: the spectrometer detects the projection on the extraordinary propagation axis of a birefringent system to measure the spectrum in that component, also the projection on the ordinary propagation axis, to measure the spectrum in that component, and finally a projection in an intermediate direction that allows to measure the interference spectrum between the two components. The method allows extracting the temporal evolution of the pulse and its polarization state as a function of time, spectral amplitudes and phases of the various polarization projections of the beam.