The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Nov. 19, 2019
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Kwan Il Lee, Seoul, KR;

Gukbeen Ryu, Seoul, KR;

Sang Bae Lee, Seoul, KR;

In Soo Kim, Seoul, KR;

Wonsuk Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); H01S 5/00 (2006.01); H01S 5/12 (2021.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35364 (2013.01); G02B 27/28 (2013.01); H01S 5/00 (2013.01); H01S 5/12 (2013.01);
Abstract

Embodiments relate to a dual Brillouin distributed optical fiber sensing system and a sensing method using Brillouin scattering that detects an event area in which an event occurred quickly by simultaneously measuring multiple correlation points located in an optical fiber under test by using a pump signal modulated with a pulsed gating signal and a continuous wave probe signal, and then precisely measures the corresponding event area by using the probe signal modulated with the pulsed gating signal and the pump signal.


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