The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Apr. 03, 2019
Applicant:

Subaru Corporation, Tokyo, JP;

Inventors:

Hideki Soejima, Tokyo, JP;

Toshimichi Ogisu, Tokyo, JP;

Assignee:

SUBARU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35338 (2013.01); G01D 5/35316 (2013.01); G01N 21/45 (2013.01);
Abstract

An optical inspection system includes an optical fiber sensor, an optical filter, a signal processor, and a corrector. The optical fiber sensor outputs a first optical signal having a temporal change in a wavelength corresponding to a temporal change in an amplitude of a vibration propagating in an inspection target object or a temporal change in a displacement of the inspection target object. The optical filter converts the first optical signal into a second optical signal having a temporal change in an intensity. The signal processor acquires inspection information on the inspection target object on the basis of the second optical signal. The corrector corrects a correspondence relationship between the temporal change in the wavelength and the temporal change in the intensity by changing a wavelength characteristic of the optical filter. The correspondence relationship is directed to converting the first optical signal into the second optical signal.


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