The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Jan. 22, 2018
Image-measuring apparatus without axial alignment and image-measuring method without axial alignment
Ming-hui Lin, Hsinchu County, TW;
Ming-Hui Lin, Hsinchu County, TW;
Other;
Abstract
An image-measuring apparatus without axial alignment is configured to measure a workpiece. The image-measuring apparatus without axial alignment includes a rotating plate, a lighting unit, an image capturing unit, a central control unit and a rotary driving member. The workpiece is disposed on the rotating plate. The lighting unit is configured to generate a light beam to illuminate the workpiece to form a first workpiece blocking shadow area on the image capturing unit. The rotating plate and the workpiece are rotated through a rotational angle by the central control unit to form a second workpiece blocking shadow area on the image capturing unit. The central control unit calculates the first workpiece blocking shadow area and the second workpiece blocking shadow area to generate an axial position of the workpiece. There is a distance between an axial position of the rotating plate and the axial position of the workpiece.