The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Dec. 06, 2016
Applicant:

Kawasaki Jukogyo Kabushiki Kaisha, Kobe, JP;

Inventors:

Atsuki Nakagawa, Kakogawa, JP;

Katsutoshi Higuma, Kakogawa, JP;

Naohiro Nakamura, Kobe, JP;

Kenta Morinaga, Marugame, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/24 (2006.01); G06F 30/00 (2020.01); G06F 30/17 (2020.01); G06T 7/564 (2017.01); G06T 7/521 (2017.01); G06T 11/20 (2006.01); G05B 19/408 (2006.01); B21D 22/18 (2006.01); B21D 22/00 (2006.01); G06F 113/24 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/24 (2013.01); G06F 30/00 (2020.01); G06F 30/17 (2020.01); G06T 7/521 (2017.01); G06T 7/564 (2017.01); G06T 11/203 (2013.01); B21D 22/00 (2013.01); B21D 22/18 (2013.01); G05B 19/408 (2013.01); G06F 2113/24 (2020.01); G06F 2119/18 (2020.01); G06T 2207/30164 (2013.01);
Abstract

A deformation processing system acquires target shape data of a work including a reference line, acquires intermediate shape data from the work having an intermediate shape having a reference line drawn thereon, puts these two pieces of data side by side by positioning the reference lines relative to each other, and calculates a necessary deformation amount of the work based on the difference between the two pieces of data put side by side.


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