The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Jul. 26, 2017
Renishaw Plc, Wotton-under-Edge, GB;
Nicholas John Weston, Peebles, GB;
Yvonne Ruth Huddart, Dunbar, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.