The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Feb. 15, 2019
The L.s. Starrett Company, Athol, MA (US);
Jeffrey M. Wilkinson, Littleton, MA (US);
THE L.S. STARRETT COMPANY, Athol, MA (US);
Abstract
A metrology device with automated compensation and/or alert for orientation errors. The device may include a processor, a probe portion and at least one orientation sensor. The probe provides an output representative of a raw measurement of a characteristic of a device under test and the orientation sensor provides a sensor output representative of an orientation of the metrology device to the device under test. The processor applies a correction factor to the raw measurement in response to the sensor output to establish a compensated measurement to compensate for misalignment of the metrology device to the device under test. In addition, or alternatively, the processor provides an alert indicating the existence and/or extent of the misalignment.