The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Feb. 05, 2018
Smiths Detection Germany Gmbh, Wiesbaden, DE;
SMITHS DETECTION GERMANY GMBH, Wiesbaden, DE;
Abstract
A production method for test X-ray includes preparation (S) of first CT data (B) of an inspection object, second CT data (BM) for metal portions of the inspection object, and third CT data (TM) for metal portions of a target object, transformation (S) of the first, second, and third CT data (B, BM, TM) from the image space (BR) into corresponding first sinogram data (SB), second sinogram data (SBM), and third sinogram data (STM) in the radon space (RR), calculation (S, S) of the artifact sinogram data (SA), back-transformation (S) of the artifact sinogram data (SA) from the radon space (RR) into the image space (BR) in CT artifact data (A) for the artifacts that are to be inserted, and insertion of the CT artifact data (A) into the first CT data (B).