The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

May. 18, 2018
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Richard Lee Kendrick, San Mateo, CA (US);

Alan Lee Duncan, Broken Arrow, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/225 (2006.01); H04N 5/378 (2011.01); G02B 23/00 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
H04N 5/332 (2013.01); G02B 6/12021 (2013.01); G02B 23/00 (2013.01); H04N 5/2256 (2013.01); H04N 5/378 (2013.01); G02B 2006/12138 (2013.01); G02B 2006/12164 (2013.01);
Abstract

An apparatus includes a first light source to produce a first reference light, a first pair of arrayed waveguide gratings (AWGs) to demultiplex a first optical signal and the first reference light, respectively, into multiple first signal beams and multiple first reference beams. A first heterodyne optical detector can mix the multiple first signal beams and the multiple first reference beams to generate first quadrature optical signals. A first pair of photo-detectors can convert the first quadrature optical signals to first in-phase (I) and quadrature (Q) electrical signals. The apparatus is implemented as a photonic integrated circuit (PIC) incorporating the first pair of AWGs, the first heterodyne optical detector and the first pair of photo-detectors.


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