The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Mar. 04, 2020
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Le Song, Hangzhou, CN;
Hui Li, Hangzhou, CN;
Zhibang Ge, Hangzhou, CN;
Xin Huang, Hangzhou, CN;
Chunyang Wen, Hangzhou, CN;
Lin Wang, Hangzhou, CN;
Tao Jiang, Hangzhou, CN;
Yiguang Wang, Hangzhou, CN;
Xiaofu Chang, Hangzhou, CN;
Guanyin Zhu, Hangzhou, CN;
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Abstract
A graphical structure model trained with labeled samples is obtained. The graphical structure model is defined based on an account relationship network that comprises a plurality of nodes and edges. The edges correspond to relationships between adjacent nodes. Each labeled sample comprises a label indicating whether a corresponding node is an abnormal node. The graphical structure model is configured to iteratively calculate, for at least one node of the plurality of nodes, an embedding vector in a hidden feature space based on an original feature of the least one node and/or a feature of an edge associated with the at least one node. A first embedding vector that corresponds to a to-be-tested sample is calculated using the graphical structure model. Abnormal account prevention and control is performed on the to-be-tested sample based on the first embedding vector.