The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Sep. 28, 2020
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Sanjay Tiwari, Bengaluru, IN;

Shihab Ponnampadikkal Abdul Rahiman, Bangalore, IN;

Mayur Kolhe, Bengaluru, IN;

Arti Kumari, Gurgaon, IN;

Neha Shishoo, Jammu, IN;

Badarayan Panigrahi, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/24 (2006.01); H04L 29/08 (2006.01); G06F 16/903 (2019.01);
U.S. Cl.
CPC ...
H04L 41/14 (2013.01); G06F 16/90335 (2019.01); H04L 67/16 (2013.01);
Abstract

The present disclosure provides a framework for quantitatively testing network services and their supporting APIs. To facilitate the testing, a testing script may be generated. The testing script may be parameterized with input data derived from a historical database. The testing script may be executed and responses received from the network during testing may be analyzed to determine metrics associated with execution of the testing script. The metrics may indicate successfully tested conditions, unsuccessfully tested conditions, untested conditions, other testing metrics, or a combination thereof. After the initial testing cycle a determination is made regarding whether a stop condition has been satisfied and if it has not been satisfied, another testing cycle may be executed. The next testing cycle may utilize a different set of input data that may be dissimilar to the input data used in the previous testing cycle so that additional conditions and functionality may be tested.


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