The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Dec. 26, 2018
S.d. Sight Diagnostics Ltd., Tel Aviv, IL;
Yuval Greenfield, Tel Aviv, IL;
Yonatan Bilu, Jerusalem, IL;
Joseph Joel Pollak, Alon Shvut, IL;
Noam Yorav-Raphael, Efrat, IL;
S.D. Sight Diagnostics Ltd., Tel Aviv, IL;
Abstract
Apparatus and methods are described for use with a cell sample. For each of one or more imaging fields of the cell sample, a depth scan of the cell sample is performed using a microscope. One of the depth levels is identified as being an optimum focal plane for imaging one or more entities within the sample using the microscope, at least partially in response to detecting that the depth level corresponds to a drop in image contrast relative to image contrast at other depth levels. Based upon the depth level identified as being the optimum focal plane for each of the one or more imaging fields of the cell sample, a scanning depth interval over which to perform a depth scan of the cell sample at a further imaging field is defined. Other applications are also described.