The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Nov. 08, 2018
Applicant:

Tetra Laval Holdings & Finance S.a., Pully, CH;

Inventors:

Johan Wendel, Genarp, SE;

Henrik Forsbäck, Lund, SE;

Bengt Ask, Lomma, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30128 (2013.01);
Abstract

A method of defect detection in packaging containers for liquid food is disclosed, where packaging containers are produced in a machine. The method comprises capturing image data of the packaging containers, defining image features in the image data representing defects in the packaging containers, associating the image features with different categories of defects, inputting the image features to a machine learning-based model for subsequent detection of categories of defects in packaging containers based on the image features, determining time stamps for the occurrence of defects in said subsequent detection, determining associated production parameters of the packaging containers in the machine for the occurrence of defects based on the time stamps, and correlating said occurrence and category of the defects with said production parameters. A system for defect detection in packaging containers is also disclosed.


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