The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jun. 04, 2020
Applicant:
Pictometry International Corp., Rochester, NY (US);
Inventors:
Frank Giuffrida, Honeoye Falls, NY (US);
Stephen Schultz, West Henrietta, NY (US);
Assignee:
Pictometry International Corp., Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); H04N 5/23222 (2013.01); H04N 7/183 (2013.01); H04N 7/185 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30184 (2013.01);
Abstract
Image capture systems including a moving platform; an image capture device having a sensor for capturing an image, the image having pixels, mounted on the moving platform; and a detection computer executing an abnormality detection algorithm for detecting an abnormality in the pixels of the image immediately after the image is captured by scanning the image utilizing predetermined parameters indicative of characteristics of the abnormality and then automatically and immediately causing a re-shoot of the image.