The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Sep. 11, 2019
Flir Systems, Inc., Wilsonville, OR (US);
Enrique Sanchez-Monge, Tampere, FI;
Alessandro Foi, Tampere, FI;
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Various techniques are disclosed for separating and removing low-frequency shadow or shading (also referred to herein as 'non-uniformity') from images that have been corrupted by the non-uniformity. A non-uniformity estimate that approximates the non-uniformity effect on the corrupted image may be generated by iteratively adding new blotches of non-uniformity data represented by two-dimensional (2D) functions, such as 2D Gaussian functions, to the non-uniformity estimate and applying filters to smoothen the 2D functions. In each iteration of the non-uniformity estimate generation process, a new non-uniformity update candidate that minimizes a cost function is identified. The corrupted image is processed based on the non-uniformity estimate to generate a corrected image.