The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jan. 26, 2021
Sas Institute Inc., Cary, NC (US);
Ryan Jeremy Parker, Raleigh, NC (US);
Clayton Adam Barker, Cary, NC (US);
Christopher Michael Gotwalt, Raleigh, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
An analytic system provides direct functional principal component analysis. (A) A next group variable value is selected from values of a group variable. (B) Explanatory variable values of observations having the selected next group variable value are sorted in ascending order. (C) The response variable value associated with each sorted explanatory variable value is stored in a next row of a data matrix. (D) (A) through (C) are repeated. (E) An eigenfunction index is incremented. (F) An FPCA is performed using the data matrix to define an eigenfunction for the eigenfunction index. (G) (E) and (F) are repeated. (H) FPCA results from the performed FPCA are presented within a window of a display. The FPCA results include an eigenvalue and an eigenfunction associated with the eigenvalue for each functional principal component identified from the performed FPCA in (F).