The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Nov. 01, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Young-Seok Kim, Suwon-si, KR;

Hwidong Na, Seongnam-si, KR;

Seongmin Ok, Yongin-si, KR;

Min-Joong Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6277 (2013.01); G06K 9/6221 (2013.01); G06K 9/6256 (2013.01); G06K 9/6281 (2013.01); G06N 3/0454 (2013.01);
Abstract

A processor-implemented classification method includes: determining a first probability vector including a first probability, for each of a plurality of classes, resulting from a classification of an input with respect to the classes; determining, based on the determined first probability vector, whether one or more of the classes represented in the first probability vector are confusing classes; adjusting, in response to one or more of the classes being the confusing classes, the determined first probability vector based on a first probability of each of the confusing classes and a maximum value of the first probabilities; determining a second probability vector including a second probability, for each of the classes, resulting from another classification of the input with respect to the classes; and performing classification on the input based on a result of a comparison between the determined second probability vector and the adjusted first probability vector.


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