The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Feb. 28, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Shunichiro Nonaka, Tokyo, JP;

Masayuki Negoro, Tokyo, JP;

Satoshi Kubota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/13 (2020.01); G06Q 10/06 (2012.01); G06Q 50/08 (2012.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 30/13 (2020.01); G06Q 10/06313 (2013.01); G06Q 10/06316 (2013.01); G06Q 10/20 (2013.01); G06Q 50/08 (2013.01);
Abstract

A structural object information search unit () acquires structural object specification information of the target structural object from the inspection result information, and searches for structural object information of a reference structural object stored in a structural object information DB (). The structural object information search unit () specifies similar reference structural object similar to the target structural object. An inspection result similarity determination unit () acquires inspection and/or repair information of the similar reference structural object from the structural object information DB (), compares the inspection and/or repair information of the similar reference structural object with a inspection result of the target structural object, and specifies inspection result information of the reference structural object used in generation of a repair plan. The repair plan generation unit () generates a repair plan of the target structural object based on the specified inspection result information.


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