The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jul. 18, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Xiangping Chen, Sherborn, MA (US);
Zvi Schneider, Tel Aviv, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
In one aspect, data replication processes include setting a minimum snap set creation interval, a maximum snap set creation interval, and a recovery time threshold (RTT). An aspect further includes creating snap sets during a synchronous replication process based on the snap set creation intervals and the RTT. The snap set creation further includes monitoring an amount of data changes since the last snap set creation, monitoring throughput statistics between a source and target system, and estimating an amount of time to replicate the data changes to the target system based on the data changes and throughput statistics. Upon determining the time to replicate the data changes reaches the RTT and the time since the last snap set creation passes the minimum interval, the snap set creation includes creating a next snap set, storing the next snap set at the source, and replicating the next snap set at the target.