The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jan. 24, 2019
International Business Machines Corporation, Armonk, NY (US);
Andrew Hicks, Wappingers Falls, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Rawlins, New Paltz, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method includes defining functional coverage by a first test suite based on a first functional coverage model of a System Under Test (SUT). The first test suite includes a first plurality of tests. The first functional coverage model includes a first plurality of attributes. The first functional coverage model defines possible combinations of values of the first plurality of attributes. Functional coverage by a second test suite is defined based on a second functional coverage model which includes a second plurality of attributes. The second functional coverage model defines possible combinations of values of the second plurality of attributes. Subsets of the first and second plurality of attributes are determined. The subsets of attributes include exclusively common attributes between the first and the second plurality of attributes. A subset of the tests is selected. The selected subset is operative to cover the first and second subsets of the attributes.