The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jul. 31, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Vidyasagar Krishnamoorthy, Fremont, VA (US);
Tarun Jaiswal, Dublin, CA (US);
Marcelo J. Goncalves, Portland, OR (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques are described herein for performing multi-dimensional selective tracing within a computer system. In one or more embodiments, the tracing profile indicates what trace data to capture based, at least in part on a set of target types and a set of target dependencies. In response to receiving a request to initiate a tracing session using the tracing profile, a topology of a set of target resources that are deployed is identified. A subset of one or more trace providers is then selected, based at least in part on the topology of the set of target resources that are deployed and the tracing profile. The subset of one or more trace providers generate trace data for a subset of target resources in the set of target resources. If the topology changes, then the set of trace providers that generate trace data may also be updated based on the tracing profile.