The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jul. 01, 2019
Veritas Technologies Llc, Santa Clara, CA (US);
Sumit Dighe, Pune, IN;
Shailesh Marathe, Pune, IN;
Veritas Technologies LLC, Santa Clara, CA (US);
Abstract
Disclosed herein are methods, systems, and processes to improve application performance in replication environments. In one embodiment, first application input/output (I/O) throughput and second application I/O throughput are associated with a data volume and are both sampled, with the first application I/O throughput being sampled while the data volume is set to an asynchronous write acknowledgement mode and the second application I/O throughput being sampled while the data volume is set to a synchronous write acknowledgement mode. A determination is made as to whether the asynchronous write acknowledgement mode or the synchronous write acknowledgement mode provides a higher application I/O throughput for the data volume. The data volume is then set to a preferred write acknowledgement mode that is selected, based on a result of the determining, from the asynchronous write acknowledgement mode and the synchronous write acknowledgement mode, and in certain embodiments, a mixed write acknowledgement mode.