The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Feb. 22, 2019
Applicant:

Toyota Motor North America, Inc., Plano, TX (US);

Inventors:

Raja Shekar Kilaru, Plano, TX (US);

Joshua Batie, Frisco, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G07C 5/00 (2006.01); G05B 19/418 (2006.01); B62D 65/00 (2006.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); B62D 65/005 (2013.01); G05B 19/41875 (2013.01); G07C 5/008 (2013.01);
Abstract

An automated manufacturing defect detection system includes processing circuitry configured to receive historical parts statistics corresponding to a failure of parts used in a vehicle assembly, receive vehicle sensor statistics corresponding to a failure of parts of post manufactured vehicles, and receive historical assembly line statistics corresponding to a failure of assembly of parts during the vehicle assembly. Additionally, the processing circuitry is configured to generate a profile for one or more parts used in the vehicle assembly, receive an analysis of each of the one or more parts of the assembled vehicle, determine whether any of the one or more analyzed parts deviate from the profile generated for that part, and in response to a determination that any of the one or more analyzed parts deviate from the profile generated for that part by greater than an expected quality threshold, automatically communicate an alert corresponding to the deviation.


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