The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Mar. 30, 2018
Centre National DE LA Recherche Scientifique (Cnrs), Paris, FR;
Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Michael Atlan, Paris, FR;
Jean-Pierre Huignard, Paris, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), Paris, FR;
ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES, Paris, FR;
DE LA VILLE DE PARIS, Paris, FR;
Abstract
According to one aspect, the invention concerns an optical imaging device () for an object (OBJ) by off-axis holography comprising a light source () adapted for emitting an illumination wave (E) on the object, in transmission or reflection, and an assembly formed by one or more thick Bragg gratings () for receiving a wave (E) coming from the object thus illuminated and for deflecting a first component (E) of the wave coming from the object, called the reference wave, and to allow a second component (E) of the wave coming from the object, called the signal wave, to pass without deflection in such a way that the deflected reference wave presents predetermined deflection angles with respect to the non-deflected signal wave defined in two perpendicular planes. The imaging device according to the first aspect further comprises a two-dimensional detection device () for acquiring an interferogram resulting from the interference between said deflected reference wave and said signal wave and a computing unit for determining, from said interferogram, an amplitude and phase distribution of the signal wave in the plane of the object (hologram).