The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Dec. 18, 2018
Supergrid Institute, Villeurbanne, FR;
Geoffrey Renon, Villeurbanne, FR;
Paul Vinson, Lyons, FR;
Supergrid Institute, Villeurbanne, FR;
Abstract
The present invention relates to a device () for measuring a magnetic field (B) and/or an electric field (E) comprising:—a measurement cell () enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect, a polarised light source () the wavelength of which is tuned to an absorption line of the gas that is sensitive to the Zeeman effect and/or to the Stark effect,—at least one polarimetry system () configured to measure a first parameter corresponding to the rotation by a polarisation angle caused by the passage of the beam () through the measurement cell () enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect,—a system () for measuring absorption, configured to measure a second parameter corresponding to the absorption of the beam () by the gas that is sensitive to the Zeeman effect and/or to the Stark effect in the measurement cell (), and a processing unit () configured to combine the measurement of the first parameter corresponding to the rotation by the polarisation angle and the absorption measurement in order to extract therefrom a third and/or fourth parameter corresponding respectively to an electric field (E) and/or a magnetic field (B) to be measured.