The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Oct. 26, 2018
Applicant:

Job Corporation, Kanagawa, JP;

Inventors:

Tsutomu Yamakawa, Kanagawa, JP;

Shuichiro Yamamoto, Kanagawa, JP;

Masahiro Okada, Kanagawa, JP;

Assignee:

JOB Corporation, Kanagawa, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/087 (2018.01); A61B 6/00 (2006.01); G01N 23/04 (2018.01); G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
G01N 23/087 (2013.01); A61B 6/4241 (2013.01); G01N 23/04 (2013.01); G01T 1/36 (2013.01); G01N 2223/206 (2013.01); G01N 2223/423 (2013.01);
Abstract

A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Z, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (Z, Z) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.


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