The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Feb. 06, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Junji Hori, Tokyo, JP;

Koji Sakata, Tokyo, JP;

Takuya Hashiguchi, Tokyo, JP;

Keita Mochizuki, Tokyo, JP;

Kiyotaka Watanabe, Tokyo, JP;

Hiroshi Sasai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01N 21/892 (2006.01); G01B 21/02 (2006.01); G01N 21/952 (2006.01); D01H 13/32 (2006.01);
U.S. Cl.
CPC ...
G01N 21/952 (2013.01); D01H 13/32 (2013.01); G01B 11/02 (2013.01); G01B 21/02 (2013.01); G01N 21/892 (2013.01);
Abstract

A phase calculation unit () calculates, as a first phase, a deflection angle of a first similarity vector having a first similarity and a second similarity calculated by a similarity calculation unit () as elements. The phase calculation unit () calculates, as a second phase, a deflection angle of a second similarity vector having a third similarity and a fourth similarity calculated by the similarity calculation unit () as elements. A period calculation unit () calculates a period of a pattern formed on a long body on the basis of the first phase and the second phase calculated by the phase calculation unit (). An abnormality detection unit () detects an abnormality in the long body on the basis of the period calculated by the period calculation unit ().


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