The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Oct. 16, 2019
Hitachi, Ltd., Tokyo, JP;
Shunsuke Kono, Tokyo, JP;
Takuya Kambayashi, Tokyo, JP;
Toshimitsu Noguchi, Tokyo, JP;
Akihiro Nojima, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In order to analyze a solution component and a scatterer component in a liquid sample more quickly, there is provided an optical analysis device including a light source unit configured to irradiate a liquid sample with light; a first light receiving unit configured to receive transmitted light emitted from the light source unit and transmitted through the liquid sample; a second light receiving unit configured to receive scattered light emitted from the light source unit and scattered by a scatterer in the liquid sample; an ultrasonic irradiation unit configured to irradiate the liquid sample with an ultrasonic wave; a reflection plate configured to reflect the ultrasonic wave that is emitted from the ultrasonic irradiation unit and propagated through the liquid sample; and a control unit configured to control the light source unit, the first light receiving unit, the second light receiving unit, and the ultrasonic irradiation unit.