The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Jun. 10, 2019
Applicant:

Nichia Corporation, Anan, JP;

Inventors:

Katsuyuki Onozuka, Nagano, JP;

Minoru Kitahara, Chino, JP;

Naohide Miyasaka, Suwa, JP;

Naoki Nakamura, Suwa-gun, JP;

Takanori Aruga, Suwa-gun, JP;

Shinobu Ito, Iwata, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0418 (2013.01); G01J 1/44 (2013.01); G01J 2001/4406 (2013.01);
Abstract

A measurement device for a light-emitting device includes a light attenuator, a photometric sphere, and a light detector. The light attenuator includes a first surface and a heat dissipator. A first light that is emitted from the first light-emitting device is incident on the first surface. The first surface is configured to absorb a portion of the first light. The heat dissipator is configured to dissipate heat of the first surface. The photometric sphere has an inner surface to reflect the first light reflected by the first surface. The light detector is configured to receive at least a portion of the first light reflected by the inner surface.


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