The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Nov. 14, 2017
Applicant:

Pioneer Corporation, Tokyo, JP;

Inventors:

Takanori Ochiai, Kawagoe, JP;

Masakazu Ogasawara, Kawagoe, JP;

Assignee:

PIONEER CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0625 (2013.01);
Abstract

An inspecting device is provided with: a radiating unit which radiates terahertz waves onto a sample laminated into a plurality of layers; a detecting unit which acquires a detected waveform by detecting terahertz waves from the sample; a selecting unit which selects a portion of a library representing an estimated waveform, on the basis of the detected waveform; and an estimating unit which estimates a position of an interface between the plurality of layers, on the basis of the detected waveform and the selected partial library.


Find Patent Forward Citations

Ochiai, Takanori. (2021). Inspection apparatus, inspection method, computer program and recording medium (U.S. Patent No. 11099001). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11099001

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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