The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Oct. 07, 2019
Ap Robotics, Llc, Rockville, MD (US);
Kam C. Lau, Potomac, MD (US);
Yongwoo Park, Frederick, MD (US);
Other;
Abstract
Disclosed herein are interferometric measurement systems and methods. In one exemplary embodiment an interferometric measuring system for measuring the distance to or displacement of an object includes: a light source; an interferometer with a measuring arm and a reference arm; a dispersive medium; and a detector. The interferometer is disposed between the light source and the object. The dispersive medium is arranged to unbalance the dispersion between the measurement arm and the reference arm. The detector is arranged to detect spectrum interference from the interferometer. In one example, the dispersive medium is a chirped fiber Bragg grating. In another example, the dispersive medium is a highly dispersive optical fiber. In one example, the light source is a broadband light source, and the detector includes a spectrometer. In another example, the light source is a wavelength swept laser, and the detector includes a photodetector or a balanced photodetector.