The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Jun. 05, 2019
Tata Consultancy Services Limited, Mumbai, IN;
Sunil Dattatraya Joshi, Thane, IN;
Mayank Mishra, Thane, IN;
Vaibhav Vyawahare, Mumbai, IN;
Shripad Salsingikar, Thane, IN;
Jayavardhana Rama Gubbi Lakshminarasimha, Bangalore, IN;
Srinivas Kotamraju, Hyderabad, IN;
Sreehari Kumar Bhogineni, Bangalore, IN;
Rishin Raj, Bengaluru, IN;
Vishnu Hariharan Anand, Bengaluru, IN;
Vishal Bajpai, Bengaluru, IN;
Jegan Mohan Ponraj, Bengaluru, IN;
Mahesh Rangarajan, Bengaluru, IN;
Balamuralidhar Purushothaman, Bengaluru, IN;
Gopi Kandaswamy, Kancheepuram, IN;
Tata Consultancy Services Limited, Mumbai, IN;
Abstract
This disclosure relates generally to systems and methods for data acquisition and asset inspection in presence of magnetic interference. Data acquisition and assets inspection systems in many infrastructures such as railway, power line, and bridges provide inaccurate results in presence of magnetic interference. The proposed system and method proposes UAV based navigation through a dynamic correction path to inspect one or more assets in one or more infrastructures. A plurality of sensors are integrated with the UAV to acquire images of the one or more assets in presence of magnetic field. The acquired images are further processed to segment and detect anomalies in one or more parts of the one or more assets. The detected anomalies are further classified as potential anomalies and non-potential anomalies. The proposed method provides accurate results with reduced processing time.