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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11098275 B1

PDFFull Text
Date of Patent:
Aug. 24, 2021

Filed:

Oct. 28, 2016

Analysis device

Applicants:

The University of Tokyo, Tokyo, JP;

Osaka University, Osaka, JP;

Inventors:

Sadao Ota, Tokyo, JP;

Issei Sato, Tokyo, JP;

Katsuhito Fujiu, Tokyo, JP;

Satoko Yamaguchi, Tokyo, JP;

Kayo Waki, Tokyo, JP;

Yoko Itahashi, Tokyo, JP;

Ryoichi Horisaki, Osaka, JP;

Assignees:

THE UNIVERSITY OF TOKYO, Tokyo, JP;

OSAKA UNIVERSITY, Osaka, JP;

Attorney:

Wilson Sonsini Goodrich & Rosati

Primary Examiner:

David P Porta

Assistant Examiner:

Mamadou Faye

Int. Cl.
CPC ...
G01N 21/49 (2006.01); C12M 1/34 (2006.01); G01N 15/14 (2006.01); G01N 21/01 (2006.01); G01N 21/27 (2006.01); G01N 21/64 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01); G01N 21/65 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
C12M 1/34 (2013.01); G01N 15/14 (2013.01); G01N 15/1404 (2013.01); G01N 15/147 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G01N 21/01 (2013.01); G01N 21/27 (2013.01); G01N 21/64 (2013.01); G01N 21/65 (2013.01); G06K 9/00147 (2013.01); G06K 9/00536 (2013.01); G06K 9/6255 (2013.01); G06K 9/6263 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/145 (2013.01); G01N 2015/1413 (2013.01); G01N 2015/1415 (2013.01);
Abstract

An analysis device includes an analysis unit configured to receive scattered light, transmitted light, fluorescence, or electromagnetic waves from an observed object located in a light irradiation region light-irradiated from a light source and analyze the observed object on the basis of a signal extracted on the basis of a time axis of an electrical signal output from a light-receiving unit configured to convert the received light or electromagnetic waves into the electrical signal.

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