The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Apr. 18, 2019
Omron Corporation, Kyoto, JP;
Haruka Fujii, Kyoto, JP;
Toshihiro Moriya, Kyoto, JP;
Takeshi Kojima, Kyoto, JP;
Norikazu Tonogai, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An interference determination apparatus includes: an acquisition unit that acquires region information indicating regions set in a configuration space in which the angles of rotation of two or three specific joints of an articulated robot are indicated by coordinate axes, the regions including an interference region in which the robot is determined to interfere with itself or an obstacle based on the magnitudes of the angles of rotation of the specific joints, and a non-interference region in which the robot is determined to not interfere with itself or an obstacle based on the magnitudes of the angles of rotation of specific joints; and a determination unit that determines whether the robot interferes with itself or an obstacle, by determining whether coordinates indicating a posture determined by the angles of rotation of the specific joints belong to the interference region or the non-interference region indicated by the acquired region information.