The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Oct. 11, 2020
Applicant:

Bertec Corporation, Columbus, OH (US);

Inventors:

Necip Berme, Worthington, OH (US);

Cameron Scott Hobson, Powell, OH (US);

Cal Thomas Haefke, Dublin, OH (US);

Assignee:

Bertec Corporation, Columbus, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A63B 24/00 (2006.01); A63B 69/00 (2006.01); A63B 69/36 (2006.01); A63B 71/06 (2006.01);
U.S. Cl.
CPC ...
A63B 24/0003 (2013.01); A63B 24/0062 (2013.01); A63B 69/0002 (2013.01); A63B 69/3667 (2013.01); A63B 71/0622 (2013.01); A63B 2069/0008 (2013.01); A63B 2069/367 (2013.01); A63B 2071/0666 (2013.01); A63B 2071/0694 (2013.01); A63B 2220/52 (2013.01); A63B 2220/54 (2013.01); A63B 2225/50 (2013.01);
Abstract

A swing analysis system is disclosed herein. The swing analysis system includes a force measurement assembly configured to receive a user; and a data processing device operatively coupled to the force measurement assembly, the data processing device is configured to receive one or more signals that are representative of forces and/or moments being applied to a top surface of the force measurement assembly by the user, and to convert the one or more signals into output forces and/or moments, the data processing device is further configured to determine one or more swing performance metrics for the user using the output forces and/or moments from the force measurement assembly.


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