The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2021
Filed:
Dec. 05, 2017
Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;
Suehiro Shimauchi, Musashino, JP;
Kana Eguchi, Yokosuka, JP;
Tsutomu Yabuuchi, Yokosuka, JP;
Kazuhiro Yoshida, Yokosuka, JP;
Osamu Mizuno, Musashino, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Chiyoda-ku, JP;
Abstract
The purpose of the present invention is to accurately identify an appearance position of a desired waveform pattern. A signal feature extraction apparatus extracts a feature peak value of a waveform pattern from an output signal of a feature extraction filter that extracts a waveform pattern of an input signal. A local maximum value detection partstores a time index and a value of the output signal when an absolute value of the output signal is equal to or more than a predetermined threshold value and takes a local maximum value. A feature peak value selection partselects a feature peak value on the basis of a difference between a time interval between the stored time index and a time index of a feature peak value selected immediately before and an average time interval at which the feature peak value can occur, and a difference between a logarithmic amplitude and phase of the output signal corresponding to the stored time index and an average logarithmic amplitude and average phase that the feature peak value can take.