The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Nov. 03, 2017
Applicant:

Stc.unm, Albuquerque, NM (US);

Inventors:

James Plusquellic, Albuquerque, NM (US);

Wenjie Che, Albuquerque, NM (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 9/32 (2006.01); G06F 21/44 (2013.01); G09C 1/00 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 17/10 (2013.01); G06F 21/44 (2013.01); G09C 1/00 (2013.01);
Abstract

The Distribution Effect is proposed for the HELP PUF that is based on purposely introducing biases in the mean and range parameters of path delay distributions to enhance entropy. The biased distributions are then used in the bitstring construction process to introduce differences in the bit values associated with path delays that would normally remain fixed. Offsets are computed to fine tune a token's digitized path delays as a means of maximizing entropy and reproducibility in the generated bitstrings: a first population-based offset method computes median values using data from multiple tokens (i.e., the population) and a second chip-specific technique is proposed which fine tunes path delays using enrollment data from the authenticating token.


Find Patent Forward Citations

Plusquellic, James. (2021). System and methods for entropy and statistical quality metrics in physical unclonable function generated bitstrings (U.S. Patent No. 11095461). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11095461

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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